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1

Young’s double-slit interference experiment with electrons

Frabboni, S., Gazzadi, G. C., Pozzi, G.

Journal:

American Journal of Physics

Year:

2007

Language:

english

File:

PDF, 925 KB

english, 2007

2

The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector

Stefano Frabboni, Alessandro Gabrielli, Gian Carlo Gazzadi, Filippo Giorgi, Giorgio Matteucci, Giulio Pozzi, Nicola Semprini Cesari, Mauro Villa, Antonio Zoccoli

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 452 KB

english, 2012

3

Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up

Frabboni, Stefano, Gazzadi, Gian Carlo, Grillo, Vincenzo, Pozzi, Giulio

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.89 MB

english, 2015

4

Two and three slit electron interference and diffraction experiments

Frabboni, Stefano, Frigeri, Cesare, Gazzadi, Gian Carlo, Pozzi, Giulio

Journal:

American Journal of Physics

Year:

2011

Language:

english

File:

PDF, 222 KB

english, 2011

5

Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope

Frabboni, Stefano, Gazzadi, Gian Carlo, Pozzi, Giulio

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 845 KB

english, 2010

6

Simultaneous increase in electrical conductivity and Seebeck coefficient in highly boron-doped nanocrystalline Si

Neophytou, Neophytos, Zianni, Xanthippi, Kosina, Hans, Frabboni, Stefano, Lorenzi, Bruno, Narducci, Dario

Journal:

Year:

2013

Language:

english

File:

PDF, 889 KB

english, 2013

7

Paradoxical Enhancement of the Power Factor of Polycrystalline Silicon as a Result of the Formation of Nanovoids

Lorenzi, B., Narducci, D., Tonini, R., Frabboni, S., Gazzadi, G. C., Ottaviani, G., Neophytou, N., Zianni, X.

Journal:

Journal of Electronic Materials

Year:

2014

Language:

english

File:

PDF, 589 KB

english, 2014

8

Influence of Grain Size on the Thermoelectric Properties of Polycrystalline Silicon Nanowires

Suriano, F., Ferri, M., Moscatelli, F., Mancarella, F., Belsito, L., Solmi, S., Roncaglia, A., Frabboni, S., Gazzadi, G.C., Narducci, D.

Journal:

Journal of Electronic Materials

Year:

2015

Language:

english

File:

PDF, 2.36 MB

english, 2015

9

Nanovoid Formation and Dynamics in He+-Implanted Nanocrystalline Silicon

Lorenzi, Bruno, Frabboni, Stefano, Gazzadi, Gian Carlo, Tonini, Rita, Ottaviani, Giampiero, Narducci, Dario

Journal:

Journal of Electronic Materials

Year:

2014

Language:

english

File:

PDF, 846 KB

english, 2014

10

On the assessment of local stress distributions in integrated circuits

J. Vanhellemont, I. De Wolf, K.G.F. Janssens, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 573 KB

english, 1993

11

Effects of thermal annealing on the structural properties of sputtered W–Si–N diffusion barriers

Alberto Vomiero, Enrico Boscolo Marchi, Stefano Frabboni, Alberto Quaranta, Gianantonio Della Mea, Gino Mariotto, Laura Felisari, Mariangela Butturi

Journal:

Materials Science in Semiconductor Processing

Year:

2004

Language:

english

File:

PDF, 411 KB

english, 2004

12

Processing high-quality silicon for microstrip detectors

F. Nava, G. Ottaviani, R. Tonini, S. Frabboni, A.Alberigi Quaranta, P. Cantoni, P.L. Frabetti, L. Stagni, G. Queirolo, P.F. Manfredi

Journal:

Sensors and Actuators A: Physical

Year:

1992

Language:

english

File:

PDF, 558 KB

english, 1992

13

Four slits interference and diffraction experiments

S. Frabboni, C. Frigeri, G.C. Gazzadi, G. Pozzi

Journal:

Ultramicroscopy

Year:

2010

Language:

english

File:

PDF, 873 KB

english, 2010

14

Low temperature dopant activation of BF2implanted silicon

G. Queirolo, C. Bresolin, D. Robba, M. Anderle, R. Canteri, A. Armigliato, G. Ottaviani, S. Frabboni

Journal:

Journal of Electronic Materials

Year:

1991

Language:

english

File:

PDF, 1.12 MB

english, 1991

15

Build-up of interference patterns with single electrons

Matteucci, Giorgio, Pezzi, Michele, Pozzi, Giulio, Alberghi, Gian Luigi, Giorgi, Filippo, Gabrielli, Alessandro, Cesari, Nicola Semprini, Villa, Mauro, Zoccoli, Antonio, Frabboni, Stefano, Gazzadi, Gi

Journal:

European Journal of Physics

Year:

2013

Language:

english

File:

PDF, 286 KB

english, 2013

16

Structure and stability of nickel/nickel oxide core–shell nanoparticles

D’Addato, S, Grillo, V, Altieri, S, Tondi, R, Valeri, S, Frabboni, S

Journal:

Journal of Physics Condensed Matter

Year:

2011

Language:

english

File:

PDF, 971 KB

english, 2011

17

Nanovoid formation in helium-implanted single-crystal silicon studied by in situ techniques

Frabboni, S., Corni, F., Nobili, C., Tonini, R., Ottaviani, G.

Journal:

Physical Review B

Year:

2004

Language:

english

File:

PDF, 1.33 MB

english, 2004

18

Power Factor Enhancement by Inhomogeneous Distribution of Dopants in Two-Phase Nanocrystalline Systems

Neophytou, Neophytos, Zianni, Xanthippi, Kosina, Hans, Frabboni, Stefano, Lorenzi, Bruno, Narducci, Dario

Journal:

Journal of Electronic Materials

Year:

2014

Language:

english

File:

PDF, 509 KB

english, 2014

19

Hydrogen-related complexes as the stressing species in high-fluence, hydrogen-implanted, single-crystal silicon

Cerofolini, G. F., Meda, L., Balboni, R., Corni, F., Frabboni, S., Ottaviani, G., Tonini, R., Anderle, M., Canteri, R.

Journal:

Physical Review B

Year:

1992

Language:

english

File:

PDF, 577 KB

english, 1992

20

Silicon de novo: energy filtering and enhanced thermoelectric performances of nanocrystalline silicon and silicon alloys

Narducci, Dario, Frabboni, Stefano, Zianni, Xanthippi

Journal:

Journal of Materials Chemistry C

Year:

2015

Language:

english

File:

PDF, 3.19 MB

english, 2015

21

Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment

Gabrielli, A, Giorgi, F, Cesari, N Semprini, Villa, M, Zoccoli, A, Matteucci, G, Pozzi, G, Frabboni, S, Gazzadi, G C

Journal:

Journal of Instrumentation

Year:

2011

Language:

english

File:

PDF, 480 KB

english, 2011

22

Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.21 MB

english, 1995

23

Transmission Electron Diffraction Techniques for Nm Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.32 MB

english, 1995

24

Bio-Herbicidal Effects of Oregano and Rosemary Essential Oils on Chamomile (Matricaria chamomilla L.) Crop in Organic Farming System

Frabboni,, Tarantino,, Petruzzi,, Disciglio,

Journal:

Year:

2019

Language:

english

File:

PDF, 798 KB

english, 2019

25

Environmental Factors and Kawasaki Disease Onset in Emilia-Romagna, Italy

Corinaldesi, Elena, Pavan, Valentina, Andreozzi, Laura, Fabi, Marianna, Selvini, Andrea, Frabboni, Ilaria, Lanzoni, Paolo, Paccagnella, Tiziana, Lanari, Marcello

Journal:

International Journal of Environmental Research and Public Health

Year:

2020

File:

PDF, 1.11 MB

2020

26

Lavender and peppermint essential oils as effective mushroom tyrosinase inhibitors: a basic study

Daniela Fiocco, Daniela Fiorentino, Laura Frabboni, Stefania Benvenuti, Giulia Orlandini, Federica Pellati, Anna Gallone

Journal:

Flavour and Fragrance Journal

Year:

2011

Language:

english

File:

PDF, 430 KB

english, 2011

27

Diagnostic Effectiveness of Serum Bile Acids in Liver Diseases as Evaluated by Multivariate Statistical Methods

Davide Festi, Antonio Maria Morselli Labate, Aldo Roda, Franco Bazzoli, Roberto Frabboni, Paola Rucci, Francesco Taroni, Rita Aldini, Enrico Roda, Luigi Barbara

Journal:

Year:

1983

Language:

english

File:

PDF, 689 KB

english, 1983

28

Observation of electrostatic fields by electron holography: The case of reverse-biased p-n junctions

S. Frabboni, G. Matteucci, G. Pozzi

Journal:

Ultramicroscopy

Year:

1987

Language:

english

File:

PDF, 1.77 MB

english, 1987

29

Electron spectroscopic imaging of dopant precipitation and segregation in silicon

S. Frabboni, G. Lulli, P.G. Merli, A. Migliori, R. Bauer

Journal:

Ultramicroscopy

Year:

1991

Language:

english

File:

PDF, 833 KB

english, 1991

30

Nanocavities in silicon: An infrared investigation of internal surface reconstruction after hydrogen implantation

E. Romano, D. Narducci, F. Corni, S. Frabboni, G. Ottaviani, R. Tonini, G.F. Cerofolini

Journal:

Materials Science and Engineering: B

Year:

2009

Language:

english

File:

PDF, 392 KB

english, 2009

31

Thermal wave measurements in ion-implanted silicon

G. Queirolo, C. Zaccherini, S. Frabboni

Journal:

Materials Science and Engineering: B

Year:

1990

Language:

english

File:

PDF, 488 KB

english, 1990

32

Silicon interstitials generation during the exposure of silicon to hydrogen plasma

R. Tonini, A. Monelli, F. Corni, S. Frabboni, G. Ottaviani, G. Queirolo

Journal:

Materials Science and Engineering: B

Year:

1996

Language:

english

File:

PDF, 356 KB

english, 1996

33

Electrical characterization of suspended Pt nanowires grown by EBID with water vapour assistance

G.C. Gazzadi, S. Frabboni, C. Menozzi, L. Incerti

Journal:

Microelectronic Engineering

Year:

2008

Language:

english

File:

PDF, 929 KB

english, 2008

34

Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures

G.C. Gazzadi, J.J.L. Mulders, P. Trompenaars, A. Ghirri, A. Rota, M. Affronte, S. Frabboni

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 574 KB

english, 2011

35

Strain field reconstruction in shallow trench isolation structures by CBED and LACBED

A. Spessot, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2006

Language:

english

File:

PDF, 745 KB

english, 2006

36

TEM study of annealed Pt nanostructures grown by electron beam-induced deposition

S. Frabboni, G.C. Gazzadi, A. Spessot

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2007

Language:

english

File:

PDF, 997 KB

english, 2007

37

Evidence for H2 at high pressure in the silicon nanocavities after dipping in HF solution

E. Romano, G.F. Cerofolini, D. Narducci, F. Corni, S. Frabboni, G. Ottaviani, R. Tonini

Journal:

Surface Science

Year:

2009

Language:

english

File:

PDF, 329 KB

english, 2009

38

Adsorption equilibria and kinetics of H2 at nearly ideal (2 × 1)Si(100) inner surfaces

G.F. Cerofolini, E. Romano, D. Narducci, F. Corni, S. Frabboni, G. Ottaviani, R. Tonini

Journal:

Surface Science

Year:

2010

Language:

english

File:

PDF, 854 KB

english, 2010

39

Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling

I De Wolf, V Senez, R Balboni, A Armigliato, S Frabboni, A Cedola, S Lagomarsino

Journal:

Microelectronic Engineering

Year:

2003

Language:

english

File:

PDF, 782 KB

english, 2003

40

Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED

A. Benedetti, A.G. Cullis, A. Armigliato, R. Balboni, S. Frabboni, G.F. Mastracchio, G. Pavia

Journal:

Applied Surface Science

Year:

2002

Language:

english

File:

PDF, 173 KB

english, 2002

41

Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns

Feng Wu, Aldo Armigliato, Roberto Balboni, Stefano Frabboni

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 777 KB

english, 1999

42

Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon

F Gambetta, S Frabboni, R Tonini, F Corni

Journal:

Materials Science and Engineering: B

Year:

2000

Language:

english

File:

PDF, 359 KB

english, 2000

43

Hydrogen and helium bubbles in silicon

G.F. Cerofolini, F. Corni, S. Frabboni, C. Nobili, G. Ottaviani, R. Tonini

Journal:

Materials Science and Engineering: R: Reports

Year:

2000

Language:

english

File:

PDF, 1.17 MB

english, 2000

44

TEM/CBED determination of strain in silicon-based submicrometric electronic devices

A Armigliato, R Balboni, S Balboni, S Frabboni, A Tixier, G.P Carnevale, P Colpani, G Pavia, A Marmiroli

Journal:

Year:

2000

Language:

english

File:

PDF, 2.42 MB

english, 2000

45

Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction

A. Armigliato, R. Balboni, S. Frabboni, A. Benedetti, A.G. Cullis, G.P. Carnevale, P. Colpani, G. Pavia

Journal:

Materials Science in Semiconductor Processing

Year:

2001

Language:

english

File:

PDF, 167 KB

english, 2001

46

Contrast of small SiX particles in silicon by computed HREM images

A. Armigliato, A. Bourret, S. Frabboni, A. Parisini

Journal:

physica status solidi (a)

Year:

1988

Language:

english

File:

PDF, 686 KB

english, 1988

47

Hydrogen precipitation in highly oversaturated single-crystalline silicon

G. F. Cerofolini, R. Balboni, D. Bisero, F. Corni, S. Frabboni, G. Ottaviani, R. Tonini, R. S. Brusa, A. Zecca, M. Ceschini, G. Giebel, L. Pavesi

Journal:

physica status solidi (a)

Year:

1995

Language:

english

File:

PDF, 2.75 MB

english, 1995

48

A tool for the spectroscopic investigation of hydrogen–silicon interaction

E. Romano, G. F. Cerofolini, D. Narducci, F. Corni, S. Frabboni, G. Ottaviani, R. Tonini

Journal:

Surface and Interface Analysis

Year:

2010

Language:

english

File:

PDF, 148 KB

english, 2010

49

On the silicon dioxide/polycrystalline silicon interface width measurement

G. Queirolo, S. Manzini, L. Meda, M. Anderle, R. Canteri, A. Armigliato, S. Frabboni

Journal:

Surface and Interface Analysis

Year:

1988

Language:

english

File:

PDF, 616 KB

english, 1988

50

Influence of implant dose and target temperature on crystal quality and junction depth of boron-doped silicon layers

R. Fabbri, M. Servidori, S. Solmi, S. Frabboni, G. Ottaviani, R. Tonini, R. Canteri

Journal:

Applied Physics A: Materials Science & Processing

Year:

1991

Language:

english

File:

PDF, 879 KB

english, 1991

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